Attendees who participate in either one full-day tutorial or two half-day tutorials will receive a certificate issued by the IEEE Reliability Society.
Professor Rui Kang (Beihang University, China) Professor Xiaoyang Li (Beihang University, China)
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Robert P. Lockard (Oraclewizard.com, Inc., USA)
Dr. Shannon Conners (JMP division of SAS, USA) Dr. Joseph Morgan (JMP division of SAS, USA)
Professor Rui Abreu (University of Lisbon, Portugal) Professor Bruno Lima (University of Porto, Portugal)
Gabe Dimeglio (Rimini Street Inc., USA)
Dr. Christof J. Budnik (Siemens Corporate Technology, USA)
